THE UPS AND DOWNS OF BEAM DAMAGE, CONTRAST AND NOISE IN BIOLOGICAL ELECTRON-MICROSCOPY

被引：7

作者：

KELLENBERGER, E

机构：

来源：

MICRON AND MICROSCOPICA ACTA | 1986年 / 17卷 / 02期

关键词：

D O I：

10.1016/0739-6260(86)90041-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：107 / 114

页数：8

共 49 条

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