AN X-RAY PHOTOEMISSION-STUDY OF CE-RH, CE-PD AND CE-AG INTERFACES

被引：16

作者：

BERG, C

RAAEN, S

机构：

[1] Inst. for Fysikk, Norges Tekniske Hogskole, Trondheim Univ.

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1992年 / 4卷 / 40期

关键词：

D O I：

10.1088/0953-8984/4/40/014

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

X-ray photoelectron spectroscopy (XPS) has been employed to study electronic states in Ce-Rh, Ce-Pd, and Ce-Ag interfaces. Thin Ce films were deposited onto evaporated substrates of Rh, Pd and Ag, and conversely, thin films of Rh, Pd and Ag were deposited onto evaporated Ce films. Tetravalent Ce emission was observed in the Rh and Pd systems. Substrate core level attenuation curves show a deviation from exponential decay as material is deposited. Substrate core level shifts as well as the appearance of a tetravalent Ce signal are indicative of interface alloy formation; however, clustering of the evaporated species may also take place.

引用

页码：8021 / 8028

页数：8

共 15 条

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