CONTROLLED GROWTH AND CRITICAL CURRENTS OF BI-TEXTURED YBA2CU3O7-DELTA FILMS ON YTTRIA-STABILIZED ZIRCONIA SUBSTRATE

被引：7

作者：

DONG, SY ^{[1
]}

KIM, DH ^{[1
]}

KWOK, HS ^{[1
]}

机构：

[1] SUNY Buffalo, DEPT ELECT & COMP ENGN, BUFFALO, NY 14260 USA

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1993年 / 212卷 / 3-4期

关键词：

D O I：

10.1016/0921-4534(93)90596-I

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Bi-textured YBa2Cu3O7-delta films of grains with different ratios of [100] to [110] can be grown controllably on (001) yttria stabilized ZrO2 substrates using pulsed laser deposition. The grain orientations were studied by X-ray measurements. It was found that the ratio of [100] to [110] grains was determined predominantly by the laser fluence. Both transport and intragranular critical currents were measured and correlated to the texture. It is shown that 45-degrees grain boundaries (GB's) are responsible for only about 18 x reduction in J(c) across polycrystalline bi-textured samples. By using a percolation calculation, the relationship between J(c) reduction across a single GB and in a polycrystalline thin film sample with many GB's was investigated. The simulation results show that the maximum J(c) reduction across a polycrystalline bi-textured sample is approximately 1/18 even if all the 45-degrees GB's are not conducting.

引用

页码：323 / 331

页数：9

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