CHARGING PHENOMENA IN THE SCANNING ELECTRON-MICROSCOPY OF CONDUCTOR-INSULATOR COMPOSITES - A TOOL FOR COMPOSITE STRUCTURAL-ANALYSIS

被引：34

作者：

CHUNG, KT

REISNER, JH

CAMPBELL, ER

机构：

来源：

关键词：

D O I：

10.1063/1.331946

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：6099 / 6112

页数：14

共 9 条

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[9] WELLS OC, 1974, SCANNING ELECTRON MI