GAIN REDUCTION MEASUREMENTS IN TRANSIENT STIMULATED RAMAN-SCATTERING

被引：24

作者：

HEEMAN, RJ ^{[1
]}

GODFRIED, HP ^{[1
]}

机构：

[1] NEDERLANDS CENTRUM LASER RES, 7500 CR ENSCHEDE, NETHERLANDS

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1995年 / 31卷 / 02期

关键词：

D O I：

10.1109/3.348067

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Threshold energy measurements of transient rotational Stimulated Raman Scattering are compared to Raman conversion calculations from semiclassical theories using a simple concept of a gain reduction factor which expresses the reduction of the gain from its steady-state value due to transient scattering. Excellent agreement was found with theoretically derived gain reduction in the transient and highly transient case.

引用

页码：358 / 364

页数：7

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