ELECTRON-MICROSCOPY OF ATOMS IN CRYSTALS

被引：22

作者：

COWLEY, JM

IIJIMA, S

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

[2] ARIZONA STATE UNIV,CTR SOLID STATE SCI,TEMPE,AZ 85281

来源：

PHYSICS TODAY | 1977年 / 30卷 / 03期

关键词：

D O I：

10.1063/1.3037451

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：32 / &

共 11 条

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[9] REFINEMENT OF DEFECT STRUCTURE OF GENB9O25 BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

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IIJIMA, S ;

COWLEY, JM .

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[10] MOLECULAR IMAGE RESOLUTION IN ELECTRON-MICROSCOPY [J].

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JOURNAL OF APPLIED PHYSICS, 1972, 43 (12) :5181-5189

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