PROTON EMISSION FROM MICROINSTABILITIES IN AN ELECTRON-BEAM DIODE

被引：8

作者：

JOHNSON, DJ ^{[1
]}

KERNS, JR ^{[1
]}

机构：

[1] USAF WEAP LAB,KIRTLAND AFB,NM 87117

来源：

关键词：

D O I：

10.1063/1.1655434

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：191 / 192

页数：2

共 7 条

BRADLEY, LP ;

KUSWA, GW .

[2]

GODFREY B, TO BE PUBLISHED

[3]

JOHNSON DJ, 1974, AFWLTR7443

[4]

Korop E. D., 1970, Zhurnal Tekhnicheskoi Fiziki, V40, P2534

[5]

KOROP ED, 1971, SOV PHYS TECH PHYS-U, V15, P1986

[6]

KUSWA GW, 1973, IEEE T NUCL SCI, VNS20, P305

[7] THEORY OF SECONDARY ELECTRON EMISSION BY HIGH-SPEED IONS [J].

STERNGLASS, EJ .

PHYSICAL REVIEW, 1957, 108 (01) :1-12