CHEMICAL IDENTIFICATION OF INDIVIDUAL SURFACE ATOMS IN ATOM PROBE

被引：12

作者：

CHAMBERS, RS

EHRLICH, G

机构：

[1] UNIV ILLINOIS,DEPT PHYS,COORDINATED SCI LAB,URBANA,IL 61801

[2] UNIV ILLINOIS,DEPT MET,URBANA,IL 61801

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1976年 / 13卷 / 01期

关键词：

D O I：

10.1116/1.568868

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：273 / 276

页数：4

共 7 条

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MCKINNEY, JT .

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[3] ATOM-PROBE FIELD ION MICROSCOPE [J].

MULLER, EW ;

PANITZ, JA ;

MCLANE, SB .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) :83-&

[4]

MULLER EW, 1971, 18TH FIELD EM S EIND

[5] 10 CM ATOM PROBE [J].

PANITZ, JA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (08) :1034-1038

[6] ATOMIC BINDING OF TRANSITION METALS ON CLEAN SINGLE-CRYSTAL TUNGSTEN SURFACES [J].

PLUMMER, EW ;

RHODIN, TN .

JOURNAL OF CHEMICAL PHYSICS, 1968, 49 (08) :3479-&

[7] USE OF A CHANNELLED IMAGE INTENSIFIER IN FIELD-ION MICROSCOPE [J].

TURNER, PJ ;

CARTWRIGHT, P ;

SOUTHON, MJ ;

VANOOSTR.A ;

MANLEY, BW .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08) :731-+

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