QUANTITATIVE THIN LAYER CHROMATOGRAPHY WITH X-RAY EMISSION SPECTROMETRY

被引：9

作者：

LIBBY, RA

机构：

来源：

ANALYTICAL CHEMISTRY | 1968年 / 40卷 / 10期

关键词：

D O I：

10.1021/ac60266a040

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1507 / &

共 20 条

[1]

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[2]

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[4]

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[6]

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FAWKES, J .

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[8] TRACE METAL ANALYSIS BY COMBINED THIN-LAYER CHROMATOGRAPHY AND REFLECTANCE SPECTROSCOPY [J].

FREI, RW ;

RYAN, DE .

ANALYTICA CHIMICA ACTA, 1967, 37 (02) :187-&

[9] APPLICATION OF SPECTRAL REFLECTANCE TO THIN-LAYER CHROMATOGRAPHY [J].

FRODYMA, MM ;

FREI, RW ;

WILLIAMS, DJ .

JOURNAL OF CHROMATOGRAPHY, 1964, 13 (01) :61-&

[10] QUANTITATIVE SCANNING OF FLUORESCENT OR LIGHT-ABSORBING SPOTS ON THIN-LAYER CHROMATOGRAMS [J].

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