MEASUREMENT OF A VERY HIGH-SPEED INGAAS PHOTODIODE USING ELECTROOPTIC SAMPLING

被引：3

作者：

TAYLOR, AJ

WIESENFELD, JM

TUCKER, RS

EISENSTEIN, G

TALMAN, JR

KOREN, U

机构：

来源：

ELECTRONICS LETTERS | 1986年 / 22卷 / 06期

关键词：

D O I：

10.1049/el:19860223

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：325 / 327

页数：3

共 7 条

[1] IMPROVED VERY-HIGH-SPEED PACKAGED INGAAS PIN PUNCH-THROUGH PHOTODIODE [J].

BURRUS, CA ;

BOWERS, JE ;

TUCKER, RS .

ELECTRONICS LETTERS, 1985, 21 (07) :262-263

[2]

EISENSTEIN G, 1986, IEEE J QUANTUM ELECT, V22

[3] ELECTROOPTIC SAMPLING WITH PICOSECOND RESOLUTION [J].

KOLNER, BH ;

BLOOM, DM ;

CROSS, PS .

ELECTRONICS LETTERS, 1983, 19 (15) :574-575

[4] ELECTROOPTIC SAMPLING OF FAST ELECTRICAL SIGNALS USING AN INGAASP INJECTION-LASER [J].

TAYLOR, AJ ;

WIESENFELD, JM ;

EISENSTEIN, G ;

TUCKER, RS ;

TALMAN, JR ;

KOREN, U .

ELECTRONICS LETTERS, 1986, 22 (02) :61-62

[5] PICOSECOND ELECTROOPTIC SAMPLING SYSTEM [J].

VALDMANIS, JA ;

MOUROU, G ;

GABEL, CW .

APPLIED PHYSICS LETTERS, 1982, 41 (03) :211-212

[6] DIRECT ELECTRO-OPTIC SAMPLING OF GAAS INTEGRATED-CIRCUITS [J].

WEINGARTEN, KJ ;

RODWELL, MJW ;

HEINRICH, HK ;

KOLNER, BH ;

BLOOM, DM .

ELECTRONICS LETTERS, 1985, 21 (17) :765-766

[7] MEASUREMENT OF VERY-HIGH-SPEED PHOTODETECTORS WITH PICOSECOND INGAASP FILM LASERS [J].

WIESENFELD, JM ;

CHRAPLYVY, AR ;

STONE, J ;

BURRUS, CA .

ELECTRONICS LETTERS, 1983, 19 (01) :22-24

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