INTERFACE DEMARCATION DURING LPE GROWTH OF GAAS

被引:7
作者
BLOM, GM
DANIELE, JJ
KYROS, T
WITT, AF
机构
[1] PHILIPS LABS, BRIARCLIFF MANOR, NY 10510 USA
[2] MIT, DEPT MAT SCI, CAMBRIDGE, MA 02138 USA
关键词
D O I
10.1149/1.2134059
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1541 / 1544
页数:4
相关论文
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