ATOMIC-DISPLACEMENT MECHANISM IN ION-BOMBARDED SEMICONDUCTORS AND INSULATORS

[1] ON ELECTRON MICROSCOPY OF FISSION FRAGMENT DAMAGE [J]. PHILOSOPHICAL MAGAZINE, 1966, 13 (121) : 185 - +

[2] COMPACTION OF ION-IMPLANTED FUSED SILICA [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (01) : 167 - 174

[3] ION EXPLOSION SPIKE MECHANISM FOR FORMATION OF CHARGED-PARTICLE TRACKS IN SOLIDS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) : 3645 - +

[4] HOLT PD, 1970, CHARGED PARTICLE TRA, P42

[5] FORMATION OF ETCHABLE TRACKS IN DIELECTRICS [J]. PHYSICAL REVIEW, 1968, 170 (02): : 401 - &

[6] KELLERER AM, 1970, CHARGED PARTICLE TRA, P77

[7] THE DISPLACEMENT OF ATOMS IN SOLIDS BY RADIATION [J]. REPORTS ON PROGRESS IN PHYSICS, 1955, 18 : 1 - 51

[8] Maurette M., 1970, Radiation Effects, V3, P149, DOI 10.1080/00337577008236268

[9] PERFORMANCE OF GERMANIUM AND SILICON SURFACE BARRIER DIODES AS ALPHA-PARTICLE SPECTROMETERS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1937 - 1944

[10] MAYER JW, 1970, ION IMPLANTATION SEM, P100

[1] ON ELECTRON MICROSCOPY OF FISSION FRAGMENT DAMAGE [J]. PHILOSOPHICAL MAGAZINE, 1966, 13 (121) : 185 - +

[2] COMPACTION OF ION-IMPLANTED FUSED SILICA [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (01) : 167 - 174

[3] ION EXPLOSION SPIKE MECHANISM FOR FORMATION OF CHARGED-PARTICLE TRACKS IN SOLIDS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) : 3645 - +

[4] HOLT PD, 1970, CHARGED PARTICLE TRA, P42

[5] FORMATION OF ETCHABLE TRACKS IN DIELECTRICS [J]. PHYSICAL REVIEW, 1968, 170 (02): : 401 - &

[6] KELLERER AM, 1970, CHARGED PARTICLE TRA, P77

[7] THE DISPLACEMENT OF ATOMS IN SOLIDS BY RADIATION [J]. REPORTS ON PROGRESS IN PHYSICS, 1955, 18 : 1 - 51

[8] Maurette M., 1970, Radiation Effects, V3, P149, DOI 10.1080/00337577008236268

[9] PERFORMANCE OF GERMANIUM AND SILICON SURFACE BARRIER DIODES AS ALPHA-PARTICLE SPECTROMETERS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1937 - 1944

[10] MAYER JW, 1970, ION IMPLANTATION SEM, P100