MOIRE PATTERNS OF ATOMIC PLANES OBTAINED BY X-RAY INTERFEROMETRY

被引:89
作者
BONSE, U
HART, M
机构
来源
ZEITSCHRIFT FUR PHYSIK | 1966年 / 190卷 / 04期
关键词
D O I
10.1007/BF01327264
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
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页码:455 / &
相关论文
共 9 条
[1]  
Amelinckx S., 1964, DIRECT OBSERVATION D
[2]   LATTICE CONSTANTS + THERMAL EXPANSIVITIES OF SILICON + OF CALCIUM FLUORIDE BETWEEN 6 DEGREES + 322 DEGREES K [J].
BATCHELDER, DN ;
SIMMONS, RO .
JOURNAL OF CHEMICAL PHYSICS, 1964, 41 (08) :2324-&
[3]   AN X-RAY INTERFEROMETER WITH LONG SEPARATED INTERFERING BEAM PATHS (E) [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 7 (04) :99-&
[4]   AN X-RAY INTERFEROMETER [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&
[5]   PRINCIPLES AND DESIGN OF LAUE-CASE X-RAY INTERFEROMETERS [J].
BONSE, U ;
HART, M .
ZEITSCHRIFT FUR PHYSIK, 1965, 188 (02) :154-&
[6]  
BONSE U, TO BE PUBLISHED
[7]   DIRECT OBSERVATION OF INDIVIDUAL DISLOCATIONS BY X-RAY DIFFRACTION [J].
LANG, AR .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) :597-598
[8]  
Timoshenko S., 1951, THEORY ELASTICITY
[9]   YOUNGS MODULUS SHEAR MODULUS AND POISSONS RATIO IN SILICON AND GERMANIUM [J].
WORTMAN, JJ ;
EVANS, RA .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (01) :153-+