A GENERALIZATION OF ATOM LOCATION BY CHANNELING ENHANCED MICROANALYSIS

被引：15

作者：

KRISHNAN, KM ^{[1
]}

THOMAS, G ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,NATL CTR ELECTRON MICROSCOPY,BERKELEY,CA 94720

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1984年 / 136卷 / OCT期

关键词：

D O I：

10.1111/j.1365-2818.1984.tb02549.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：97 / 101

页数：5

共 8 条

[1]

Borrmann G, 1941, PHYS Z, V42, P157

BOURDILLON, AJ ;

SELF, PG ;

STOBBS, WM .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 44 (06) :1335-1350

COWLEY, JM .

ACTA CRYSTALLOGRAPHICA, 1964, 17 (01) :33-&

GJONNES, J ;

HOIER, R .

[5] SITE OCCUPATION OF TERNARY ELEMENTS IN SM2 (COTM)17 COMPOUNDS [J].

KRISHNAN, KM ;

RABENBERG, L ;

MISHRA, RK ;

THOMAS, G .

[6]

KRISHNAN KM, 1984, THESIS U CALIFORNIA

[7]

KRISHNAN KM, 1984, P ELECTRON MICROSCOP, V31, P79

[8] ALCHEMI - A NEW TECHNIQUE FOR LOCATING ATOMS IN SMALL CRYSTALS [J].

SPENCE, JCH ;

TAFTO, J .

JOURNAL OF MICROSCOPY-OXFORD, 1983, 130 (MAY) :147-154