PERFORMANCE AND RELIABILITY OF NIST 10-V JOSEPHSON ARRAYS

被引：7

作者：

HAMILTON, CA

BURROUGHS, CJ

机构：

[1] National Institute of Standards and Technology, Boulder

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1995年 / 44卷 / 02期

关键词：

D O I：

10.1109/19.377820

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper reviews eight gears of fabrication of 10-V Josephson array chips at NIST, and the performance and reliability of these chips at 22 different standards laboratories. Failure mechanisms and statistical data on failure rates are presented for devices made with both Nb/Nb2O5/Pb and Nb/Al2O3/Nb junctions.

引用

页码：238 / 240

页数：3

共 6 条

[1] HIGH-QUALITY REFRACTORY JOSEPHSON TUNNEL-JUNCTIONS UTILIZING THIN ALUMINUM LAYERS [J].