TESTING OF SUBMICROMETER FLUORESCENCE MICROPROBE BASED ON BRAGG-FRESNEL CRYSTAL OPTICS AT THE ESRF

被引：17

作者：

SNIGIREV, A

SNIGIREVA, I

ENGSTROM, P

LEQUIEN, S

SUVOROV, A

HARTMAN, Y

CHEVALLIER, P

IDIR, M

LEGRAND, F

SOULLIE, G

ENGRAND, S

机构：

[1] RUSSIAN ACAD SCI,INST MICROELECTR TECHNOL,CHERNOGOLOVKA 142432,RUSSIA

[2] UNIV PARIS 11,LURE,F-91405 ORSAY,FRANCE

[3] UNIV PARIS 06,CHIM PHYS LAB,F-75005 PARIS,FRANCE

[4] UNIV PARIS 11,CSNSM,F-91405 ORSAY,FRANCE

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 02期

关键词：

D O I：

10.1063/1.1145941

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An x-ray fluorescence microprobe with circular Bragg-Fresnel lens was tested at the European Synchrotron Radiation Facility Microfocus beamline. A focal spot of 0.7 μm was observed using the knife-edge technique at the energy 7.6 keV (wavelength 1.6 Å). The intensity in the focal spot was measured to 108 ph/s in energy bandwidth of 10-5. The fluorescence microprobe was applied for mapping 100 μm size micrometeorite at 13.5 keV. © 1995 American Institute of Physics.

引用

页码：1461 / 1463

页数：3

共 7 条

[1] ARISTOV VV, 1992, I PHYS C SER, V130, P523
[2] KIRKPATRICK-BAEZ MICROPROBE ON THE BASIS OF 2 LINEAR SINGLE-CRYSTAL BRAGG-FRESNEL LENSES
BONSE, U
RIEKEL, C
SNIGIREV, AA
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) : 622 - 624
[3] CHAVANNE J, 1994, REV SCI INSTRUM, V65, P1959
[4] CHEVALLIER P, IN PRESS NIM
[5] KUZNETSOV SM, 1994, APPL PHYS LETT, V65, P1
[6] A DOUBLE FOCUSING SAXS CAMERA WITH MU-M FOCAL SPOT BASED ON A CIRCULAR BRAGG-FRESNEL LENS
SNIGIREV, A
SNIGIREVA, I
RIEKEL, C
MILLER, A
WESS, L
WESS, T
[J]. JOURNAL DE PHYSIQUE IV, 1993, 3 (C8): : 443 - 446
[7] SNIGIREV A, 1995, REV SCI INSTRUMENT 2, V66

← 1 →