GRAIN-BOUNDARY SEGREGATION IN ALUMINUM-DOPED SILICON-CARBIDE

被引:33
作者
TAJIMA, Y [1 ]
KINGERY, WD [1 ]
机构
[1] MIT,DEPT MAT SCI & ENGN,DIV CERAM,CAMBRIDGE,MA 02139
关键词
D O I
10.1007/BF00543738
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:2289 / 2297
页数:9
相关论文
共 17 条
[1]  
[Anonymous], ELECT MICROPROBE
[2]   ABSORPTION EFFECTS IN STEM MICROANALYSIS OF CERAMIC OXIDES [J].
BENDER, BA ;
WILLIAMS, DB ;
NOTIS, MR .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1980, 63 (3-4) :149-151
[3]  
BOCKER W, 1979, POWDER METALL INT, V11, P83
[4]  
BOCKER W, 1978, POWDER METALL INT, V10, P87
[5]   QUANTITATIVE-ANALYSIS OF THIN SPECIMENS [J].
CLIFF, G ;
LORIMER, GW .
JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :203-207
[6]  
COBLENZ WS, 1981, THESIS MASSACHUSETTS
[7]  
Goldstein JI, 1977, SCANNING ELECTRON MI, V1, P315
[8]   SINTERING OF COVALENT SOLIDS [J].
GRESKOVICH, C ;
ROSOLOWSKI, JH .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1976, 59 (7-8) :336-343
[9]   GRAIN-BOUNDARY SEGREGATION IN CERAMICS [J].
JOHNSON, WC .
METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1977, 8 (09) :1413-1422
[10]  
McLean D., 1957, GRAIN BOUNDARIES MET, P118