METROLOGY OF REFLECTION OPTICS FOR SYNCHROTRON RADIATION

被引:15
作者
TAKACS, PZ
机构
关键词
D O I
10.1016/0168-9002(86)90080-X
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:227 / 241
页数:15
相关论文
共 32 条
[1]   X-RAY TELESCOPES [J].
ASCHENBACH, B .
REPORTS ON PROGRESS IN PHYSICS, 1985, 48 (05) :579-629
[2]   MEASUREMENT OF SURFACE-TOPOGRAPHY OF MAGNETIC TAPES BY MIRAU INTERFEROMETRY [J].
BHUSHAN, B ;
WYANT, JC ;
KOLIOPOULOS, CL .
APPLIED OPTICS, 1985, 24 (10) :1489-1497
[3]   SURFACE IMAGING BY SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
ROHRER, H .
ULTRAMICROSCOPY, 1983, 11 (2-3) :157-160
[4]  
BORN M, 1980, PRINCIPLES OPTICS, pCH9
[5]  
Church E. L., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V257, P254
[6]  
Church E. L., 1979, P SOC PHOTO-OPT INS, V184, P196
[7]  
CHURCH EL, 1984, P SOC PHOTO-OPT INST, V511, P18
[8]   RELATIONSHIP BETWEEN SURFACE SCATTERING AND MICROTOPOGRAPHIC FEATURES [J].
CHURCH, EL ;
JENKINSON, HA ;
ZAVADA, JM .
OPTICAL ENGINEERING, 1979, 18 (02) :125-136
[9]   MEASUREMENT OF SURFACE TEXTURE AND TOPOGRAPHY BY DIFFERENTIAL LIGHT-SCATTERING [J].
CHURCH, EL .
WEAR, 1979, 57 (01) :93-105
[10]   MEASUREMENT OF FINISH OF DIAMOND-TURNED METAL-SURFACES BY DIFFERENTIAL LIGHT-SCATTERING [J].
CHURCH, EL ;
JENKINSON, HA ;
ZAVADA, JM .
OPTICAL ENGINEERING, 1977, 16 (04) :360-374