A PHOTOELECTRON AND SECONDARY ION MASS-SPECTROMETRIC STUDY OF THE CHEMICAL-COMPOSITION OF THERMAL OXIDE LAYERS ON TECHNICALLY PURE ALUMINUM

被引：51

作者：

TEXTOR, M

GRAUER, R

机构：

来源：

CORROSION SCIENCE | 1983年 / 23卷 / 01期

关键词：

D O I：

10.1016/0010-938X(83)90058-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：41 / 53

页数：13

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