THE IMAGE-CONTRAST OF SURFACE STEPS IN REFLECTION ELECTRON-MICROSCOPY

被引：60

作者：

COWLEY, JM

PENG, L

机构：

[1] Department of Physics, Arizona State University, Tempe, AZ 85287, United States

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 01期

关键词：

We are grateful to Dr. K. Yagi and associates at the Tokyo Institute of Technology for valuable discussions relevant to this paper and to Dr. Tung Hsu who provided the REM images. This work was supported by the NSF US-Japan Cooperative Research program (Grant INT-8114364) and by the NSF Division of Materials Research (Grant DMR-792646) and made use of the resources of the ASU Facility for High Resolution Electron Microscopy; supported by NSF Grant DMR-8306501;

D O I：

10.1016/S0304-3991(85)80008-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：59 / 67

页数：9

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