SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY

被引:439
作者
FADLEY, CS
BAIRD, RJ
SIEKHAUS, W
NOVAKOV, T
BERGSTROM, SA
机构
[1] UNIV HAWAII, DEPT CHEM, HONOLULU, HI 96822 USA
[2] LAWRENCE BERKELEY LAB, NUCL CHEM DIV, BERKELEY, CA 94720 USA
[3] LINKOPING UNIV, PHYS DEPT, LINKOPING, SWEDEN
关键词
D O I
10.1016/0368-2048(74)90001-2
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:93 / 137
页数:45
相关论文
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