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POWDER DIFFRACTION PEAK SHAPES - PARAMETERIZATION OF THE PSEUDO-VOIGT AS A VOIGT FUNCTION
被引:80
作者
:
DAVID, WIF
论文数:
0
引用数:
0
h-index:
0
DAVID, WIF
机构
:
来源
:
JOURNAL OF APPLIED CRYSTALLOGRAPHY
|
1986年
/ 19卷
关键词
:
D O I
:
10.1107/S0021889886089999
中图分类号
:
O6 [化学];
学科分类号
:
0703 ;
摘要
:
引用
收藏
页码:63 / 64
页数:2
相关论文
共 12 条
[1]
A VOIGTIAN AS PROFILE SHAPE FUNCTION IN RIETVELD REFINEMENT
[J].
AHTEE, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
AHTEE, M
;
UNONIUS, L
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNONIUS, L
;
NURMELA, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
NURMELA, M
;
SUORTTI, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
SUORTTI, P
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1984,
17
(OCT)
:352
-357
[2]
PROFILE REFINEMENT OF POWDER DIFFRACTION PATTERNS USING THE VOIGT FUNCTION
[J].
DAVID, WIF
论文数:
0
引用数:
0
h-index:
0
DAVID, WIF
;
MATTHEWMAN, JC
论文数:
0
引用数:
0
h-index:
0
MATTHEWMAN, JC
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1985,
18
(DEC)
:461
-466
[3]
DAVID WIF, 1984, RAL84064 RUTH APPL L
[4]
USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING
[J].
DEKEIJSER, TH
论文数:
0
引用数:
0
h-index:
0
DEKEIJSER, TH
;
LANGFORD, JI
论文数:
0
引用数:
0
h-index:
0
LANGFORD, JI
;
MITTEMEIJER, EJ
论文数:
0
引用数:
0
h-index:
0
MITTEMEIJER, EJ
;
VOGELS, ABP
论文数:
0
引用数:
0
h-index:
0
VOGELS, ABP
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1982,
15
(JUN)
:308
-314
[5]
EFFICIENT COMPUTATION OF COMPLEX ERROR FUNCTION
[J].
GAUTSCHI, W
论文数:
0
引用数:
0
h-index:
0
GAUTSCHI, W
.
SIAM JOURNAL ON NUMERICAL ANALYSIS,
1970,
7
(01)
:187
-&
[6]
SYNCHROTRON X-RAY-POWDER DIFFRACTION
[J].
HASTINGS, JB
论文数:
0
引用数:
0
h-index:
0
HASTINGS, JB
;
THOMLINSON, W
论文数:
0
引用数:
0
h-index:
0
THOMLINSON, W
;
COX, DE
论文数:
0
引用数:
0
h-index:
0
COX, DE
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1984,
17
(APR)
:85
-95
[7]
LINE PROFILES OF NEUTRON POWDER-DIFFRACTION PEAKS FOR STRUCTURE REFINEMENT
[J].
RIETVELD, HM
论文数:
0
引用数:
0
h-index:
0
RIETVELD, HM
.
ACTA CRYSTALLOGRAPHICA,
1967,
22
:151
-&
[8]
A PROFILE REFINEMENT METHOD FOR NUCLEAR AND MAGNETIC STRUCTURES
[J].
RIETVELD, HM
论文数:
0
引用数:
0
h-index:
0
RIETVELD, HM
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1969,
2
:65
-&
[9]
DETERMINATION OF GAUSSIAN AND LORENTZIAN CONTENT OF EXPERIMENTAL LINE-SHAPES
[J].
WERTHEIM, GK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
WERTHEIM, GK
;
BUTLER, MA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUTLER, MA
;
WEST, KW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
WEST, KW
;
BUCHANAN, DN
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUCHANAN, DN
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1974,
45
(11)
:1369
-1371
[10]
A NEW COMPUTER-PROGRAM FOR RIETVELD ANALYSIS OF X-RAY-POWDER DIFFRACTION PATTERNS
[J].
WILES, DB
论文数:
0
引用数:
0
h-index:
0
机构:
ENGN EXPT STN,ATLANTA,GA 30332
ENGN EXPT STN,ATLANTA,GA 30332
WILES, DB
;
YOUNG, RA
论文数:
0
引用数:
0
h-index:
0
机构:
ENGN EXPT STN,ATLANTA,GA 30332
ENGN EXPT STN,ATLANTA,GA 30332
YOUNG, RA
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1981,
14
(APR)
:149
-151
←
1
2
→
共 12 条
[1]
A VOIGTIAN AS PROFILE SHAPE FUNCTION IN RIETVELD REFINEMENT
[J].
AHTEE, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
AHTEE, M
;
UNONIUS, L
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNONIUS, L
;
NURMELA, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
NURMELA, M
;
SUORTTI, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND
SUORTTI, P
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1984,
17
(OCT)
:352
-357
[2]
PROFILE REFINEMENT OF POWDER DIFFRACTION PATTERNS USING THE VOIGT FUNCTION
[J].
DAVID, WIF
论文数:
0
引用数:
0
h-index:
0
DAVID, WIF
;
MATTHEWMAN, JC
论文数:
0
引用数:
0
h-index:
0
MATTHEWMAN, JC
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1985,
18
(DEC)
:461
-466
[3]
DAVID WIF, 1984, RAL84064 RUTH APPL L
[4]
USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING
[J].
DEKEIJSER, TH
论文数:
0
引用数:
0
h-index:
0
DEKEIJSER, TH
;
LANGFORD, JI
论文数:
0
引用数:
0
h-index:
0
LANGFORD, JI
;
MITTEMEIJER, EJ
论文数:
0
引用数:
0
h-index:
0
MITTEMEIJER, EJ
;
VOGELS, ABP
论文数:
0
引用数:
0
h-index:
0
VOGELS, ABP
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1982,
15
(JUN)
:308
-314
[5]
EFFICIENT COMPUTATION OF COMPLEX ERROR FUNCTION
[J].
GAUTSCHI, W
论文数:
0
引用数:
0
h-index:
0
GAUTSCHI, W
.
SIAM JOURNAL ON NUMERICAL ANALYSIS,
1970,
7
(01)
:187
-&
[6]
SYNCHROTRON X-RAY-POWDER DIFFRACTION
[J].
HASTINGS, JB
论文数:
0
引用数:
0
h-index:
0
HASTINGS, JB
;
THOMLINSON, W
论文数:
0
引用数:
0
h-index:
0
THOMLINSON, W
;
COX, DE
论文数:
0
引用数:
0
h-index:
0
COX, DE
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1984,
17
(APR)
:85
-95
[7]
LINE PROFILES OF NEUTRON POWDER-DIFFRACTION PEAKS FOR STRUCTURE REFINEMENT
[J].
RIETVELD, HM
论文数:
0
引用数:
0
h-index:
0
RIETVELD, HM
.
ACTA CRYSTALLOGRAPHICA,
1967,
22
:151
-&
[8]
A PROFILE REFINEMENT METHOD FOR NUCLEAR AND MAGNETIC STRUCTURES
[J].
RIETVELD, HM
论文数:
0
引用数:
0
h-index:
0
RIETVELD, HM
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1969,
2
:65
-&
[9]
DETERMINATION OF GAUSSIAN AND LORENTZIAN CONTENT OF EXPERIMENTAL LINE-SHAPES
[J].
WERTHEIM, GK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
WERTHEIM, GK
;
BUTLER, MA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUTLER, MA
;
WEST, KW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
WEST, KW
;
BUCHANAN, DN
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUCHANAN, DN
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1974,
45
(11)
:1369
-1371
[10]
A NEW COMPUTER-PROGRAM FOR RIETVELD ANALYSIS OF X-RAY-POWDER DIFFRACTION PATTERNS
[J].
WILES, DB
论文数:
0
引用数:
0
h-index:
0
机构:
ENGN EXPT STN,ATLANTA,GA 30332
ENGN EXPT STN,ATLANTA,GA 30332
WILES, DB
;
YOUNG, RA
论文数:
0
引用数:
0
h-index:
0
机构:
ENGN EXPT STN,ATLANTA,GA 30332
ENGN EXPT STN,ATLANTA,GA 30332
YOUNG, RA
.
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1981,
14
(APR)
:149
-151
←
1
2
→