APPLICATION OF A SIMPLE DIFFERENTIAL INTERFEROMETER TO HIGH-CURRENT ARC DISCHARGES

被引：31

作者：

KOGELSCHATZ, U ^{[1
]}

机构：

[1] BROWN BOVERI RES CTR, CH-5401 BADEN, SWITZERLAND

来源：

APPLIED OPTICS | 1974年 / 13卷 / 08期

关键词：

D O I：

10.1364/AO.13.001749

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1749 / 1752

页数：4

共 16 条

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[9] QUANTITATIVE SCHLIEREN TECHNIQUES APPLIED TO HIGH CURRENT ARC INVESTIGATIONS [J].

KOGELSCHATZ, U ;

SCHNEIDER, WR .

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[10] A SIMPLE SCHLIEREN INTERFEROMETER SYSTEM [J].

MERZKIRCH, WF .

AIAA JOURNAL, 1965, 3 (10) :1974-+

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