MULTIFUNCTIONAL, MICROPIPETTE BASED FORCE CANTILEVERS FOR SCANNED PROBE MICROSCOPY

We demonstrate quartz micropipette and optical fiber based structures with unique applications for scanned probe microscopy. These probes are produced by drawing, cantilevering, and polishing tapered micropipettes and optical fibers and have significantly greater potential functionality than any other currently available scanning tip. We present normal force, contact mode imaging of a selection of surfaces, operating these probes with different commercial instruments for atomic force microscopy (AFM). With their very sharp tips, ultrahigh aspect ratios, and readily adjustable force constants and resonance frequencies, the probes present an attractive alternative to conventional microfabricated cantilevers that are currently in routine use with AFM. Bent quartz optical fiber probes also enable simple integration of near-field scanning optical microscopy and AFM.