A DISPLAY-TYPE ANALYZER WITH AN IMAGE-PROCESSING SYSTEM FOR ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY

被引:56
作者
RIEGER, D [1 ]
SCHNELL, RD [1 ]
STEINMANN, W [1 ]
SAILE, V [1 ]
机构
[1] DESY,HAMBURGER SYNCHROTRONSTRAHLUNGSLAB,D-2000 HAMBURG 52,FED REP GER
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期
关键词
D O I
10.1016/0167-5087(83)91220-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:777 / 784
页数:8
相关论文
共 10 条
[1]   AN ELLIPSOIDAL MIRROR DISPLAY ANALYZER SYSTEM FOR ELECTRON-ENERGY AND ANGULAR MEASUREMENTS [J].
EASTMAN, DE ;
DONELON, JJ ;
HIEN, NC ;
HIMPSEL, FJ .
NUCLEAR INSTRUMENTS & METHODS, 1980, 172 (1-2) :327-336
[2]   NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTI-CHANNELING MODE .1. DESIGN ASPECTS AND ELECTRON-ION OPTICAL-PROPERTIES [J].
ENGELHARDT, HA ;
BACK, W ;
MENZEL, D ;
LIEBL, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (06) :835-839
[3]   NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTICHANNELING MODE .2. PHYSICAL REALIZATION, PERFORMANCE TESTS, AND SAMPLE SPECTRA [J].
ENGELHARDT, HA ;
ZARTNER, A ;
MENZEL, D .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (08) :1161-1173
[4]  
Granneman E., 1983, HDB SYNCHROTRON RAD, V1A, pChap 6
[5]   THEORY OF ANGLE-RESOLVED PHOTOEMISSION FROM BULK BANDS OF SOLIDS .2. APPLICATION TO AG(111) [J].
LIEBOWITZ, D ;
SHEVCHIK, NJ .
PHYSICAL REVIEW B, 1978, 18 (04) :1630-1636
[6]   ANGLE RESOLVED PHOTOEMISSION IN SOLIDS [J].
PETROFF, Y ;
THIRY, P .
APPLIED OPTICS, 1980, 19 (23) :3957-3963
[7]   HIGH-RESOLUTION PHOTOEMISSION FROM AG(100), AG(110), AND AG(111) [J].
ROLOFF, HF ;
NEDDERMEYER, H .
SOLID STATE COMMUNICATIONS, 1977, 21 (06) :561-564
[8]  
SMITH NV, 1983, HDB SYNCHROTRON RAD, V1, pCH9
[9]   POSITION-SENSITIVE DETECTOR SYSTEM FOR ANGLE-RESOLVED ELECTRON-SPECTROSCOPY WITH A CYLINDRICAL MIRROR ANALYZER [J].
VANHOOF, HA ;
VANDERWIEL, MJ .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (04) :409-414
[10]   VIDICON-CAMERA PARALLEL-DETECTION SYSTEM FOR ANGLE-RESOLVED ELECTRON-SPECTROSCOPY [J].
WEEKS, SP ;
ROWE, JE ;
CHRISTMAN, SB ;
CHABAN, EE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (10) :1249-1255