CONTRIBUTION OF ELECTRON-ENERGY LOSS SPECTROSCOPY TO DEVELOPMENT OF ANALYTICAL ELECTRON-MICROSCOPY

被引:81
作者
COLLIEX, C
COSSLETT, VE
LEAPMAN, RD
TREBBIA, P
机构
[1] UNIV PARIS 11,CNRS,PHYS SOLIDE LAB,F-91405 ORSAY,FRANCE
[2] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 OHE,ENGLAND
关键词
D O I
10.1016/0304-3991(76)90048-6
中图分类号
TH742 [显微镜];
学科分类号
摘要
The combined use of an electron energy loss spectrometer and an electron microscope provides some chemical information at the nanometer scale. The physics of the interaction processes between the incident electron beam and the thin sample foil is reviewed in terms of energy and momentum transfer. This analysis of the content of an electron energy loss spectrum allows us to establish rules for a satisfactory use of the information and to discuss the detection limits of this newly developing microanalytical technique.
引用
收藏
页码:301 / 315
页数:15
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