CRYSTALLOGRAPHIC ASPECTS OF THIN PTSI FILMS ON SI SUBSTRATES

被引:9
作者
RICHARDS, BP [1 ]
SCOBEY, IH [1 ]
WALLACE, CA [1 ]
机构
[1] GEC, HIRST RES CTR, CENT RES LABS, WEMBLEY, ENGLAND
来源
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1974年 / 7卷 / APR1期
关键词
D O I
10.1107/S0021889874009526
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
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页码:275 / 280
页数:6
相关论文
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