TESTING ASPHERICS USING 2-WAVELENGTH HOLOGRAPHY - USE OF DIGITAL ELECTRONIC TECHNIQUES

被引：36

作者：

WYANT, JC ^{[1
]}

OREB, BF ^{[1
]}

HARIHARAN, P ^{[1
]}

机构：

[1] CSIRO,DIV APPL PHYS,SYDNEY,NSW 2070,AUSTRALIA

来源：

APPLIED OPTICS | 1984年 / 23卷 / 22期

关键词：

D O I：

10.1364/AO.23.004020

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：4020 / 4023

页数：4

共 8 条

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[2] REAL-TIME HOLOGRAPHIC-INTERFEROMETRY - A MICROCOMPUTER SYSTEM FOR THE MEASUREMENT OF VECTOR DISPLACEMENTS [J].

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[3] HIGH-PRECISION DIGITAL INTERFEROMETRY - ITS APPLICATION TO THE PRODUCTION OF AN ULTRATHIN SOLID FABRY-PEROT ETALON [J].

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WYANT, JC .

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[5]

SCHWIDER J, 1983, APPL OPT, V23, P3421

[6]

WYANT JC, 1974, APPL OPTICS, V13, P2762, DOI 10.1364/AO.13.002762

[7] TESTING ASPHERICS USING WAVELENGTH HOLOGRAPHY [J].

WYANT, JC .

APPLIED OPTICS, 1971, 10 (09) :2113-&

[8] USING COMPUTER GENERATED HOLOGRAMS TO TEST ASPHERIC WAVEFRONTS [J].

WYANT, JC ;

BENNETT, VP .

APPLIED OPTICS, 1972, 11 (12) :2833-&

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