EXTENDED X-RAY ABSORPTION FINE-STRUCTURE IN PHOTOELECTRON EMISSION

被引：38

作者：

ROTHBERG, GM

CHOUDHARY, KM

DENBOER, ML

WILLIAMS, GP

HECHT, MH

LINDAU, I

机构：

[1] POLYTECH INST NEW YORK,BROOKLYN,NY 11201

[2] BROOKHAVEN NATL LAB,UPTON,NY 11973

[3] STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305

来源：

PHYSICAL REVIEW LETTERS | 1984年 / 53卷 / 12期

关键词：

D O I：

10.1103/PhysRevLett.53.1183

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1183 / 1186

页数：4

共 16 条

[1] DIRECT SURFACE-STRUCTURE DETERMINATION WITH PHOTOELECTRON DIFFRACTION
BARTON, JJ
BAHR, CC
HUSSAIN, Z
ROBEY, SW
TOBIN, JG
KLEBANOFF, LE
SHIRLEY, DA
[J]. PHYSICAL REVIEW LETTERS, 1983, 51 (04) : 272 - 275
[2] SURFACE-STRUCTURE DETERMINATIONS BY MEANS OF OFF-NORMAL PHOTOELECTRON DIFFRACTION - A KINEMATICAL ANALYSIS
BULLOCK, EL
FADLEY, CS
ORDERS, PJ
[J]. PHYSICAL REVIEW B, 1983, 28 (08): : 4867 - 4870
[3] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111)
CITRIN, PH
EISENBERGER, P
HEWITT, RC
[J]. PHYSICAL REVIEW LETTERS, 1978, 41 (05) : 309 - 312
[4] EXTENDED APPEARANCE-POTENTIAL FINE-STRUCTURE ANALYSIS - OXYGEN ON A1(100)
DENBOER, ML
EINSTEIN, TL
ELAM, WT
PARK, RL
ROELOFS, LD
[J]. PHYSICAL REVIEW LETTERS, 1980, 44 (07) : 496 - 500
[5] MEASUREMENT OF TRANSMISSION OF VUV MONOCHROMATORS AND ELECTRON SPECTROMETERS USING PHOTOEMISSION SPECTROSCOPY
HECHT, MH
LINDAU, I
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2): : 339 - 342
[6] NEW METHOD FOR CALCULATION OF ATOMIC PHASE-SHIFTS - APPLICATION TO EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) IN MOLECULES AND CRYSTALS
LEE, PA
BENI, G
[J]. PHYSICAL REVIEW B, 1977, 15 (06): : 2862 - 2883
[7] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL
LEE, PA
CITRIN, PH
EISENBERGER, P
KINCAID, BM
[J]. REVIEWS OF MODERN PHYSICS, 1981, 53 (04) : 769 - 806
[8] POSSIBILITY OF ADSORBATE POSITION DETERMINATION USING FINAL-STATE INTERFERENCE EFFECTS
LEE, PA
[J]. PHYSICAL REVIEW B, 1976, 13 (12): : 5261 - 5270
[9] PHOTON-ENERGY DEPENDENCE OF THE CORE-LEVEL PEAK INTENSITY IN PHOTOELECTRON-SPECTRA - A STUDY OF THE EXTENDED FINE-STRUCTURE
MARGARITONDO, G
KATNANI, AD
STOFFEL, NG
LEVY, F
[J]. PHYSICAL REVIEW B, 1980, 22 (06): : 2777 - 2785
[10] NEAREST-NEIGHBOR BACKSCATTERING EFFECTS IN ANGLE-INTEGRATED PHOTOEMISSION SPECTROSCOPY OF CORE LEVELS
MARGARITONDO, G
STOFFEL, NG
[J]. PHYSICAL REVIEW LETTERS, 1979, 42 (23) : 1567 - 1570

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