CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .1. EIGENVALUE DEGENERACY IN 3-BEAM CASE

被引:9
作者
GEVERS, R [1 ]
SERNEELS, R [1 ]
DAVID, M [1 ]
机构
[1] RIJKS UNIV CENTRUM ANTWERPEN,FAK WETENSCHAPPEN,ANTWERPEN,BELGIUM
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1974年 / 66卷 / 02期
关键词
D O I
10.1002/pssb.2220660209
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:471 / 482
页数:12
相关论文
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