THE STRUCTURE OF NA2BESIO4 OBTAINED BY THE RIETVELD PROFILE REFINEMENT TECHNIQUE

被引：14

作者：

FROSTANG, S

GRINS, J

LOUER, D

WERNER, PE

机构：

[1] UNIV STOCKHOLM,ARRHENIUS LAB,DEPT STRUCT CHEM,S-10691 STOCKHOLM,SWEDEN

[2] UNIV STOCKHOLM,ARRHENIUS LAB,DEPT INORGAN CHEM,S-10691 STOCKHOLM,SWEDEN

[3] UNIV RENNES 1,CRISTALLOCHIM LAB,CNRS,UA 254,F-35042 RENNES,FRANCE

来源：

SOLID STATE IONICS | 1988年 / 31卷 / 02期

关键词：

Compendex;

D O I：

10.1016/0167-2738(88)90297-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Crystals

引用

页码：131 / 138

页数：8

共 16 条

[1] IONIC-CONDUCTIVITY STUDIES AND PHASE-ANALYSIS OF THE NA2BESIO4-NA2BESI2O6 SYSTEM [J].

FROSTANG, S ;

GRINS, J ;

NYGREN, M .

JOURNAL OF SOLID STATE CHEMISTRY, 1988, 72 (01) :92-99

[2]

FROSTANG S, 1988, CHEM SCRIPTA, V28, P107

[3]

FROSTANG S, UNPUB

[4] IONIC-CONDUCTIVITY OF SODIUM ZINC SILICATES IN THE COMPOSITIONAL REGION NA2ZNSIO4-NA2ZNSI2O6 [J].

GRINS, J .

SOLID STATE IONICS, 1982, 7 (02) :157-164

[5] PHASE-ANALYSIS AND IONIC-CONDUCTIVITY STUDIES OF THE NA2ZNGEO4-NA2ZNGE2O6 SYSTEM [J].

GRINS, J ;

NYGREN, M .

SOLID STATE IONICS, 1983, 9-10 (DEC) :869-876

[6] IONIC CONDUCTIVITIES IN COMPOUNDS BASED ON CHEMICAL SUBSTITUTIONS IN NA2ZNSIO4 [J].

GRINS, J .

SOLID STATE IONICS, 1986, 18-9 :577-581

[7] AN AUTOMATIC MICRO-DENSITOMETER FOR X-RAY-POWDER DIFFRACTION PHOTOGRAPHS [J].

JOHANSSON, KE ;

PALM, T ;

WERNER, PE .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (12) :1289-1291

[8] CRISTOBALITES AND TOPOLOGICALLY-RELATED STRUCTURES [J].

OKEEFFE, M ;

HYDE, BG .

ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1976, 32 (NOV15) :2923-2936

[9]

Parthe E., 1963, Z KRISTALLOGR, V119, P204

[10]

Plakhov G. F., 1975, Soviet Physics - Doklady, V19, P556

← 1 2 →