UNCERTAINTY IN THE RESIDUAL-STRESSES ANALYSIS BY X-RAYS DIFFRACTION

被引：9

作者：

KAHLOUN, C ^{[1
]}

BADAWI, KF ^{[1
]}

DIOU, A ^{[1
]}

机构：

[1] IUT,GER LAB,LE CREUSOT,FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1990年 / 25卷 / 12期

关键词：

D O I：

10.1051/rphysap:0199000250120122500

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1225 / 1238

页数：14

共 11 条

[1] BADAWI KF, 1986, THESIS U REIMS
[2] BOURQUINEL B, 1988, THESIS U NANTES
[3] CASTEX L, 1981, PUBLICATIONS SCIENTI, V22
[4] COHEN JB, 1979, P S ACCURACY POWDER
[5] DEVIGNES M, 1985, NOUVEL APPAREIL DIFF, V10
[6] DOLLE H, 1980, METALL TRANS A, V11, P159
[7] DOLLE H, 1979, Z METALLKD, V70, P682
[8] INFLUENCE OF MULTIAXIAL STRESS STATES, STRESS GRADIENTS AND ELASTIC-ANISOTROPY ON THE EVALUATION OF (RESIDUAL) STRESSES BY X-RAYS
DOLLE, H
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (DEC): : 489 - 501
[9] MAEDER G, 1984, DEFINITION ORDRES CO, V10
[10] PRESSE, 1986, NUMERICAL RECIPES CA