HARD X-RAY SPUTTERED-SLICED PHASE ZONE PLATES

被引：25

作者：

BIONTA, RM ^{[1
]}

SKULINA, KM ^{[1
]}

WEINBERG, J ^{[1
]}

机构：

[1] UNIV ARIZONA,TUCSON,AZ 85726

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 08期

关键词：

Aluminum - Copper - Focusing - Image analysis - Mathematical models - Monte Carlo methods - Optical variables measurement - Phase shift - Photons - Radiography - Refractive index - Thickness measurement;

D O I：

10.1063/1.110968

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Al/Cu sputtered-sliced phase zone plates, designed to operate with a focal length of 18 cm at 8.05 keV, were tested at the Stanford Synchrotron Radiation Laboratory. First-, second-, and third-order peaks are measured, along with a defocused condition. The first-order focusing efficiencies ranged from 13% to 19% for the two lenses presented here. Monte Carlo simulations are compared to the data.

引用

页码：945 / 947

页数：3

共 5 条

[1] TABLETOP X-RAY MICROSCOPE USING 8 KEV ZONE PLATES [J].

BIONTA, RM ;

ABLES, E ;

CLAMP, O ;

EDWARDS, OD ;

GABRIELE, PC ;

MILLER, K ;

OTT, LL ;

SKULINA, KM ;

TILLEY, R ;

VIADA, T .

OPTICAL ENGINEERING, 1990, 29 (06) :576-580

[2]

BIONTA RM, 1988, SPIE, V984, P247

[3]

Henke B L, 1988, LBL26259

[4] HARD X-RAY PHASE ZONE PLATE FABRICATED BY LITHOGRAPHIC TECHNIQUES [J].

LAI, B ;

YUN, WB ;

LEGNINI, D ;

XIAO, Y ;

CHRZAS, J ;

VICCARO, PJ ;

WHITE, V ;

BAJIKAR, S ;

DENTON, D ;

CERRINA, F ;

DIFABRIZIO, E ;

GENTILI, M ;

GRELLA, L ;

BACIOCCHI, M .

APPLIED PHYSICS LETTERS, 1992, 61 (16) :1877-1879

[5]

YUN WB, 1990, SPIE P, V1345, P146

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