PROGRESS IN MULTILAYER DEVICES AS X-RAY OPTICAL-ELEMENTS

被引:2
作者
DHEZ, P [1 ]
机构
[1] UNIV PARIS 11,UTILISAT RAYONNEMENT ELECTROMAGNET LAB,F-91405 ORSAY,FRANCE
来源
JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 138卷 / JUN期
关键词
D O I
10.1111/j.1365-2818.1985.tb02620.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:267 / 277
页数:11
相关论文
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