INVESTIGATION OF THE STRUCTURE OF T-PHASE AL62CU20CO15SI3 BY FAST ION CHANNELING

被引:3
作者
PLACHKE, D
KUPKE, T
CARSTANJEN, HD
EMRICK, RM
机构
[1] UNIV STUTTGART,INST THEORET & ANGEW PHYS,W-7000 STUTTGART 80,GERMANY
[2] UNIV ARIZONA,TUCSON,AZ 85721
关键词
D O I
10.1016/0022-3093(93)90317-Q
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The paper demonstrates, for the case of a T-phase Al62Cu20Co15Si3 quasicrystal, how fast ion channeling in combination with Rutherford backscattering and ion-induced X-ray emission may be used to provide information on the axial and planar structure of a quasicrystal as well as on the decoration of its structure by the various atoms present in such an alloy. The experimental channeling profiles are compared with profiles calculated on the basis of a structure model derived by Steurer and Kuo [Philos. Mag. Lett. 62 (1990) 175] from X-ray diffraction data.
引用
收藏
页码:72 / 76
页数:5
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