VERY SHARP PLATINUM TIPS FOR SCANNING-TUNNELING-MICROSCOPY

被引:96
作者
LIBIOULLE, L [1 ]
HOUBION, Y [1 ]
GILLES, JM [1 ]
机构
[1] FAC UNIV NOTRE DAME PAIX,INST STUDIES INTERFACE SCI,UNITE INTERFAC MICROSCOPIE ELECTR,B-5000 NAMUR,BELGIUM
关键词
D O I
10.1063/1.1146153
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
To achieve both high stability for scanning tunneling microscopy (STM) measurements and well-defined tunnel current localization even on very rough surfaces, we have developed a new electrochemical procedure using CaCl 2 etching and H2SO4 micro polishing technique to obtain a very reproducible tip geometry. The mean curvature radius is about 50 Å. The contamination-free platinum tips are usable for a long time as well in air as in ultrahigh vacuum. The tip quality has been tested by STM measurements on gold (111) surfaces and on liquid-crystal films. Tips are stable and provide good STM image in far less time than commonly used tips. © 1995 American Institute of Physics.
引用
收藏
页码:97 / 100
页数:4
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