PHOTOEMISSION EXTENDED X-RAY ABSORPTION FINE-STRUCTURE OF OXIDIZED AL FILMS

被引：12

作者：

KIM, ST

CHOUDHARY, KM

SHAH, SN

LEE, JH

ROTHBERG, GM

DENBOER, ML

WILLIAMS, GP

机构：

[1] STEVENS INST TECHNOL,HOBOKEN,NJ 07030

[2] CUNY HUNTER COLL,NEW YORK,NY 10021

[3] BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE,UPTON,NY 10021

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.574687

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：623 / 626

页数：4

共 29 条

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[5] PHOTOEMISSION EXAFS MEASUREMENTS OF AL-0 BOND LENGTHS IN AL FILMS
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[J]. JOURNAL DE PHYSIQUE, 1986, 47 (C-8): : 203 - 207
[6] CHOUDHARY KM, 1985, THESIS STEVENS I TEC
[7] CHOUDHARY KM, 1984, EXAFS NEAR EDGE STRU, V3, P264
[8] SURFACE SENSITIVE SPECTROSCOPIC STUDY OF THE INTERACTION OF OXYGEN WITH A1(111) - LOW-TEMPERATURE CHEMISORPTION AND OXIDATION
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[J]. SURFACE SCIENCE, 1986, 165 (01) : 37 - 64
[9] SURFACE EXTENDED ENERGY-LOSS FINE-STRUCTURES ABOVE THE K-EDGE OF OXYGEN ON AL
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CHIARELLO, G
COLAVITA, E
ROSEI, R
[J]. SOLID STATE COMMUNICATIONS, 1982, 44 (06) : 845 - 847
[10] EXTENDED APPEARANCE-POTENTIAL FINE-STRUCTURE ANALYSIS - OXYGEN ON A1(100)
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[J]. PHYSICAL REVIEW LETTERS, 1980, 44 (07) : 496 - 500

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