PARTIAL-BOUNDARY ELEMENT METHOD FOR ANALYSIS OF STRIPLINES WITH ARBITRARY CROSS-SECTIONAL DIELECTRIC IN MULTILAYERED MEDIA

被引:8
作者
ATSUKI, K
LI, K
机构
[1] Department of Electronic Engineering, The University of Electro-Communications
关键词
D O I
10.1109/22.382079
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new method of analysis called the partial-boundary element method (p-BEM) is proposed for the analysis of striplines with arbitrary cross-sectional dielectric in multi-layered media. By using a Green's function that satisfies the boundary conditions of a relevant structure with multi-layered media and introducing a concept of the equivalent charge density, the p-BEM formulates a potential integral and boundary integral equations only on partial-boundaries such as the surface of the arbitrary cross-sectional dielectric. The number of the equations needed to be formulated is much less than in the conventional BEM. Numerical results of analysis are presented for two kinds of striplines: 1) with a rectangular dielectric ridge and 2) with an embedded rectangular dielectric in three-layered media.
引用
收藏
页码:1153 / 1161
页数:9
相关论文
共 12 条
[1]  
Brebbia C.A., 1978, BOUNDARY ELEMENT MET
[2]  
CHANG TN, 1990, IEEE T MICROW THEORY, V38, P1130, DOI 10.1109/22.57340
[3]  
COLLIN RE, 1991, FIELD THEORY GUIDED, pCH2
[4]   ACCURATE CHARACTERIZATION AND MODELING OF TRANSMISSION-LINES FOR GAAS MMICS [J].
FINLAY, HJ ;
JANSEN, RH ;
JENKINS, JA ;
EDDISON, IG .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1988, 36 (06) :961-967
[6]   INDIRECT BOUNDARY ELEMENT METHOD APPLIED TO GENERALIZED MICROSTRIPLINE ANALYSIS WITH APPLICATIONS TO SIDE-PROXIMITY EFFECT IN MMICS [J].
LI, KR ;
FUJII, Y .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1992, 40 (02) :237-244
[7]  
SCHROEDER S, 1989, IEEE T MICROW THEORY, P711
[8]  
SEQUEIRA HB, 1989, IEEE T MICROWAVE THE, V34, P1333
[9]   MICROSTRIP TRANSMISSION-LINE WITH FINITE-WIDTH DIELECTRIC [J].
SMITH, CE ;
CHANG, RS .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1980, 28 (02) :90-94
[10]  
Tokumitsu T., 1990, IEEE T MICROW THEORY, P831