FUNCTIONAL TESTING OF TFT/LCD ARRAYS

被引:16
作者
JENKINS, LC
POLASTRE, RJ
TROUTMAN, RR
WISNIEFF, RL
机构
[1] IBM Research Div, Yorktown Heights, NY
关键词
D O I
10.1147/rd.361.0059
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The thin-film-transistor liquid crystal display (TFT/LCD) is emerging as the leading flat-panel display in computer applications. TFT array characterization is important to the research, development, and manufacturing of TFT/LCDs. This paper describes a new Dynamic Array Tester developed for that purpose and describes some examples of its use.
引用
收藏
页码:59 / 68
页数:10
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