FUNCTIONAL TESTING OF TFT/LCD ARRAYS

被引：16

作者：

JENKINS, LC

POLASTRE, RJ

TROUTMAN, RR

WISNIEFF, RL

机构：

[1] IBM Research Div, Yorktown Heights, NY

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1992年 / 36卷 / 01期

关键词：

D O I：

10.1147/rd.361.0059

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The thin-film-transistor liquid crystal display (TFT/LCD) is emerging as the leading flat-panel display in computer applications. TFT array characterization is important to the research, development, and manufacturing of TFT/LCDs. This paper describes a new Dynamic Array Tester developed for that purpose and describes some examples of its use.

引用

页码：59 / 68

页数：10