APPLICATION LIMITS IN USING BACKSCATTERED RADIATION FOR MATRIX CORRECTION IN X-RAY-FLUORESCENCE ANALYSIS

被引：3

作者：

GEORGE, R ^{[1
]}

SCHIEKEL, M ^{[1
]}

机构：

[1] TECH UNIV DRESDEN,SEKT PHYS,DDR-8027 DRESDEN,GER DEM REP

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1983年 / 79卷 / 02期

关键词：

D O I：

10.1007/BF02518935

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：233 / 243

页数：11

共 20 条

[1] SCATTERED X-RAYS AS INTERNAL STANDARDS IN X-RAY EMISSION SPECTROSCOPY [J].

ANDERMANN, G ;

KEMP, JW .

ANALYTICAL CHEMISTRY, 1958, 30 (08) :1306-1309

[2] EFFECTS OF X-RAY ABSORPTION IN THE ANALYSIS OF THICK TARGET SAMPLES BY XRF [J].

BAPTISTA, GB ;

MONTENEGRO, EC ;

LEITE, CVB ;

PASCHOA, AS .

JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1980, 60 (01) :227-235

[3] CALCULATION OF SAMPLE ABSORPTION BY MEANS OF COMPTON-SCATTERING IN X-RAY-DIFFRACTION ANALYSIS [J].

BARON, P ;

ZEVIN, L ;

LACH, S .

X-RAY SPECTROMETRY, 1981, 10 (02) :57-60

[4] RAPID X-RAY FLUORESCENCE DETERMINATION OF TRACES OF STRONTIUM IN SAMPLES OF BIOLOGICAL AND GEOLOGICAL ORIGIN [J].

CHAMPION, KP ;

TAYLOR, JC ;

WHITTEM, RN .

ANALYTICAL CHEMISTRY, 1966, 38 (01) :109-&

[5]

CLARK SP, 1966, HDB PHYSICAL CONSTAN

[6] DETERMINATION OF X-RAY MASS ABSORPTION-COEFFICIENT BY MEASUREMENT OF INTENSITY OF AG K-ALPHA COMPTON SCATTERED RADIATION [J].

FRANZINI, M ;

LEONI, L ;

SAITTA, M .

X-RAY SPECTROMETRY, 1976, 5 (02) :84-87

[7]

GEORGE R, UNPUB Z ANGEWANDTE G

[8] DETERMINATION OF TRACE-ELEMENTS IN LIGHT-ELEMENT MATRICES BY X-RAY-FLUORESCENCE SPECTROMETRY WITH INCOHERENT SCATTERED RADIATION AS AN INTERNAL STANDARD [J].

GIAUQUE, RD ;

GARRETT, RB ;

GODA, LY .

ANALYTICAL CHEMISTRY, 1979, 51 (04) :511-516

[9] CORRECTIONS FOR SCATTERING IN X-RAY-FLUORESCENCE EXPERIMENTS [J].

KEITH, HD ;

LOOMIS, TC .

X-RAY SPECTROMETRY, 1978, 7 (04) :225-240

[10] MATRIX EFFECT CORRECTIONS BY AG K-ALPHA-COMPTON SCATTERED RADIATION IN ANALYSIS OF ROCK SAMPLES FOR TRACE-ELEMENTS [J].

LEONI, L ;

SAITTA, M .

X-RAY SPECTROMETRY, 1977, 6 (04) :181-186

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