MODIFIED TECHNIQUE FOR DETERMINING WAVELENGTH-SENSITIVITY CURVE OF A SPECTROFLUORIMETER

被引：59

作者：

MELHUISH, WH ^{[1
]}

机构：

[1] INST NUCL SCI,DEPT SCI & IND RES,LOWER HUTT,NEW ZEALAND

来源：

APPLIED OPTICS | 1975年 / 14卷 / 01期

关键词：

D O I：

10.1364/AO.14.000026

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：26 / 27

页数：2

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[1] CALIBRATION OF SPECTROFLUORIMETERS FOR MEASURING CORRECTED EMISSION SPECTRA
MELHUISH, WH
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (11) : 1256 - &
[2] ABSOLUTE SPECTROFLUOROMETRY
MELHUISH, WH
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION C-ENGINEERING AND INSTRUMENTATION, 1972, A 76 (06): : 547 - 560
[3] FAST AND ACCURATE METHOD FOR MEASURING PHOTON FLUX IN RANGE 2500-6000 A
YGUERABIDE, J
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (07) : 1048 - +