DIODE-ARRAY SPECTROMETER - AN OPTIMIZED DESIGN

[1] BITTNER R, 1983, OPTIK, V64, P185

[2] OPITZ W, 1980, BMFT T80142 FORSCH B

[3] OPTICAL THICKNESS MEASUREMENT OF THIN TRANSPARENT FILMS ON SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) : 3804 - &

[4] 1980, LICHTLEITFASERN SCHO

[5] 1985, TECHNICAL CHARACTERI

[6] 1980, G SERIES SOLID STATE

[7] 1980, DIFFRACTION GRATINGS

[1] BITTNER R, 1983, OPTIK, V64, P185

[2] OPITZ W, 1980, BMFT T80142 FORSCH B

[3] OPTICAL THICKNESS MEASUREMENT OF THIN TRANSPARENT FILMS ON SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) : 3804 - &

[4] 1980, LICHTLEITFASERN SCHO

[5] 1985, TECHNICAL CHARACTERI

[6] 1980, G SERIES SOLID STATE

[7] 1980, DIFFRACTION GRATINGS