OPTICAL DIFFERENTIATION OF DISPLACEMENT PATTERNS USING MOIRE INTERFEROMETRY

被引：10

作者：

PATORSKI, K

KUJAWINSKA, M

机构：

来源：

APPLIED OPTICS | 1985年 / 24卷 / 18期

关键词：

D O I：

10.1364/AO.24.003041

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3041 / 3048

页数：8

共 24 条

[1] DISPLACEMENT-FIELDS (U,W) OBTAINED SIMULTANEOUSLY BY MOIRE INTERFEROMETRY [J].

BASEHORE, ML ;

POST, D .

APPLIED OPTICS, 1982, 21 (14) :2558-2562

[2] RONCHI TEST FORMULAS .1. THEORY [J].

BRIERS, JD .

OPTICS AND LASER TECHNOLOGY, 1979, 11 (04) :189-196

[3]

BRUTTI C, 1978, P SPIE, V136, P296

[4] DIFFERENTIATION OF MOIRE PATTERNS BY OPTICAL SPATIAL-FILTERING [J].

CHIANG, FP ;

KHETAN, RP .

JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1975, 42 (01) :25-28

[5] 2ND AND 3RD OPTICAL DIFFERENTIATION BY DOUBLE MOIRE DEFLECTOMETRY [J].

KAFRI, O ;

LIVNAT, A .

APPLIED OPTICS, 1983, 22 (14) :2115-2117

[6] IMPROVEMENT OF THE METHOD OF MEASURING INPLANE, NORMAL STRAIN USING INTERFEROMETRY OF DIFFRACTION BEAMS [J].

KATO, K ;

MUROTA, T .

BULLETIN OF THE JSME-JAPAN SOCIETY OF MECHANICAL ENGINEERS, 1981, 24 (194) :1372-1378

[7] FINITE FRINGE SHADOW MOIRE SLOPE MAPPING OF DIFFUSIVE OBJECTS [J].

LIVNAT, A ;

KAFRI, O .

APPLIED OPTICS, 1983, 22 (20) :3232-3235

[8] IMPROVEMENT ON MOIRE TECHNIQUE FOR IN-PLANE DEFORMATION MEASUREMENTS [J].

MATSUMOTO, K ;

TAKASHIMA, M .

APPLIED OPTICS, 1973, 12 (04) :858-864

[9]

McDonach A., 1983, Experimental Techniques, V7, P20, DOI 10.1111/j.1747-1567.1983.tb01766.x

[10] USE OF SINGLE PLANE PARALLEL PLATE AS LATERAL SHEARING INTERFEROMETER WITH VISIBLE GAS LASER SOURCE [J].

MURTY, MVR .

APPLIED OPTICS, 1964, 3 (04) :531-&

← 1 2 3 →