STM LIGHT-EMISSION SPECTROSCOPY OF SURFACE MICROSTRUCTURES ON GRANULAR AU FILMS

被引：54

作者：

ITO, K ^{[1
]}

OHYAMA, S ^{[1
]}

UEHARA, Y ^{[1
]}

USHIODA, S ^{[1
]}

机构：

[1] TOHOKU UNIV,ELECT COMMUN RES INST,SENDAI,MIYAGI 98077,JAPAN

来源：

SURFACE SCIENCE | 1995年 / 324卷 / 2-3期

关键词：

D O I：

10.1016/0039-6028(94)00674-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Light emission spectra from the gap region of a scanning tunneling microscope (STM) have been measured simultaneously with the cross-section of the surface topography. The spectra consist of two components centered about 1.7 and 2.0 eV. The intensity ratio between these components varies as the tip moves along different surface structures on the sample. We have found a correlation between the light emission spectra and the surface topography. We suggest a mechanism that can qualitatively explain the observed position-dependent spectra.

引用

页码：282 / 288

页数：7

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