ABSOLUTE INTENSITY MEASUREMENT OF SMALL ANGLE X-RAY SCATTERING BY MEANS OF A STANDARD SAMPLE

被引：378

作者：

KRATKY, O

PILZ, I

SCHMITZ, PJ

机构：

来源：

关键词：

D O I：

10.1016/0095-8522(66)90078-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：24 / &

共 34 条

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