STEP-STEP INTERACTIONS DUE TO ANISOTROPIC SURFACE STRESS

被引:13
作者
KOCHANSKI, GP
机构
[1] AT and T Bell Laboratories, Murray Hill
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 17期
关键词
D O I
10.1103/PhysRevB.41.12334
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
I have derived the effective potential that controls the motion of a single step on a crystal like Si(001) that has two inequivalent surface domains. The behavior of the steps is controlled by such a potential times a correlation length that measures the stiffness of the step edge against kinking. This correlation length may be of order 100 lattice constants. The potential derived here is compared with published images, by measuring the amplitude of thermal fluctuations in the step-edge positions. © 1990 The American Physical Society.
引用
收藏
页码:12334 / 12337
页数:4
相关论文
共 14 条
[1]   SPONTANEOUS FORMATION OF STRESS DOMAINS ON CRYSTAL-SURFACES [J].
ALERHAND, OL ;
VANDERBILT, D ;
MEADE, RD ;
JOANNOPOULOS, JD .
PHYSICAL REVIEW LETTERS, 1988, 61 (17) :1973-1976
[2]   STABILITIES OF SINGLE-LAYER AND BILAYER STEPS ON SI(001) SURFACES [J].
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (15) :1691-1694
[3]   STATISTICAL PROPERTIES OF STEPS ON CRYSTAL-SURFACES [J].
GILMER, GH ;
WEEKS, JD .
JOURNAL OF CHEMICAL PHYSICS, 1978, 68 (03) :950-958
[4]   STEPS ON SI(001) [J].
GRIFFITH, JE ;
KOCHANSKI, GP ;
KUBBY, JA ;
WIERENGA, PE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :1914-1918
[5]  
GRIFFITH JE, 1988, MRS S P, V116
[6]   SCANNING-TUNNELING-MICROSCOPY STUDY OF SINGLE-DOMAIN SI(001) SURFACES GROWN BY MOLECULAR-BEAM EPITAXY [J].
HOEVEN, AJ ;
LENSSINCK, JM ;
DIJKKAMP, D ;
VANLOENEN, EJ ;
DIELEMAN, J .
PHYSICAL REVIEW LETTERS, 1989, 63 (17) :1830-1832
[7]   TUNNELING MICROSCOPY OF GE(001) [J].
KUBBY, JA ;
GRIFFITH, JE ;
BECKER, RS ;
VICKERS, JS .
PHYSICAL REVIEW B, 1987, 36 (11) :6079-6093
[8]  
LANDAU LD, 1959, THEORY ELASTICITY, P26
[9]   SI(100) SURFACE UNDER AN EXTERNALLY APPLIED STRESS [J].
MEN, FK ;
PACKARD, WE ;
WEBB, MB .
PHYSICAL REVIEW LETTERS, 1988, 61 (21) :2469-2471
[10]   TOTAL ENERGY AND STRESS OF METAL AND SEMICONDUCTOR SURFACES [J].
PAYNE, MC ;
ROBERTS, N ;
NEEDS, RJ ;
NEEDELS, M ;
JOANNOPOULOS, JD .
SURFACE SCIENCE, 1989, 211 (1-3) :1-20