LASER-FREQUENCY MIXING IN THE JUNCTION OF A SCANNING TUNNELING MICROSCOPE

被引：30

作者：

ARNOLD, L ^{[1
]}

KRIEGER, W ^{[1
]}

WALTHER, H ^{[1
]}

机构：

[1] TECH UNIV MUNICH,SEKT PHYS,D-8046 GARCHING,FED REP GER

来源：

APPLIED PHYSICS LETTERS | 1987年 / 51卷 / 11期

关键词：

D O I：

10.1063/1.98866

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：786 / 788

页数：3

共 20 条

[1] PHOTOTHERMAL MODULATION OF THE GAP DISTANCE IN SCANNING TUNNELING MICROSCOPY
AMER, NM
SKUMANICH, A
RIPPLE, D
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (03) : 137 - 139
[2] EXTENSION OF ABSOLUTE-FREQUENCY MEASUREMENTS TO THE VISIBLE - FREQUENCIES OF 10 HYPERFINE COMPONENTS OF IODINE
BAIRD, KM
EVENSON, KM
HANES, GR
JENNINGS, DA
PETERSEN, FR
[J]. OPTICS LETTERS, 1979, 4 (09) : 263 - 264
[3] BINNIG G, 1986, SURF SCI, V169, pL295, DOI 10.1016/0039-6028(86)90596-0
[4] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY
BINNIG, G
FUCHS, H
GERBER, C
ROHRER, H
STOLL, E
TOSATTI, E
[J]. EUROPHYSICS LETTERS, 1986, 1 (01): : 31 - 36
[5] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61
[6] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE
BRYANT, A
SMITH, DPE
QUATE, CF
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834
[7] TRAVERSAL TIME FOR TUNNELING
BUTTIKER, M
LANDAUER, R
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 451 - 454
[8] RESPONSE OF METAL-INSULATOR-METAL POINT CONTACT DIODES TO VISIBLE LASER-LIGHT
DANIEL, HU
STEINER, M
WALTHER, H
[J]. APPLIED PHYSICS, 1981, 25 (01): : 7 - 12
[9] MECHANISM OF DETECTION OF RADIATION IN A HIGH-SPEED METAL-METAL OXIDE-METAL JUNCTION IN VISIBLE REGION AND AT LONGER WAVELENGTHS
ELCHINGER, GM
SANCHEZ, A
DAVIS, CF
JAVAN, A
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (02) : 591 - 594
[10] TUNABLE FAR-INFRARED SPECTROSCOPY
EVENSON, KM
JENNINGS, DA
PETERSEN, FR
[J]. APPLIED PHYSICS LETTERS, 1984, 44 (06) : 576 - 578

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