SCRATCH TEST FOR MEASURING ADHERENCE OF THIN FILMS TO OXIDE SUBSTRATES

[1] BATESON S, 1952, VACUUM, V2, P365

[2] BENJAMIN P, 1960, P ROY SOC, VA254, P163

[3] BENJAMIN P, 1960, P ROY SOC, VA254, P177

[4] BOWIE MH, 1963, THESIS LEHIGH U BETH

[5] FREDERICK JC, 1964, J APPL PHYS, V35, P257

[6] SOME FACTORS INFLUENCING THE ADHESION OF FILMS PRODUCED BY VACUUM EVAPORATION [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1950, 11 (07): : 355 - 360

[7] INTERFACE FORMATION DURING THIN FILM DEPOSITION [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (08) : 2493 - &

[8] AGEING EFFECTS IN BIMETALLIC FILMS [J]. PHILOSOPHICAL MAGAZINE, 1959, 4 (46): : 1107 - 1125

[9] 1960, HANDBOOK CHEMISTRY P, P1882

[1] BATESON S, 1952, VACUUM, V2, P365

[2] BENJAMIN P, 1960, P ROY SOC, VA254, P163

[3] BENJAMIN P, 1960, P ROY SOC, VA254, P177

[4] BOWIE MH, 1963, THESIS LEHIGH U BETH

[5] FREDERICK JC, 1964, J APPL PHYS, V35, P257

[6] SOME FACTORS INFLUENCING THE ADHESION OF FILMS PRODUCED BY VACUUM EVAPORATION [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1950, 11 (07): : 355 - 360

[7] INTERFACE FORMATION DURING THIN FILM DEPOSITION [J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (08) : 2493 - &

[8] AGEING EFFECTS IN BIMETALLIC FILMS [J]. PHILOSOPHICAL MAGAZINE, 1959, 4 (46): : 1107 - 1125

[9] 1960, HANDBOOK CHEMISTRY P, P1882