AFM AND XRD INVESTIGATION OF CRYSTALLINE VAPOR-DEPOSITED C-60 FILMS

被引：13

作者：

ATAMNY, F

BAIKER, A

MUHR, HJ

NESPER, R

机构：

[1] ETH ZURICH,ETH ZENTRUM,DEPT CHEM ENGN & IND CHEM,CH-8092 ZURICH,SWITZERLAND

[2] ETH ZURICH,ETH ZENTRUM,DEPT INORGAN CHEM,CH-8092 ZURICH,SWITZERLAND

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1995年 / 353卷 / 3-4期

关键词：

D O I：

10.1007/BF00322083

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The morphological and structural properties of C-60 films deposited on quartz substrates by sublimation at 320-500 degrees C under high vacuum have been investigated using atomic force microscopy (AFM) and reflection Xray diffraction (RXRD). The thickness of the films varied between 0.2 mu m and 10 mu m. AFM showed that the films consist predominantly of cubic crystals of a few micrometer in size with well-developed (111) and (100) faces. The crystallographic investigation revealed a strongly preferred [111] growth direction which is very sensitive to the deposition rate and substrate temperature. The influence of the experimental parameters on the morphology of the crystals and on the preferred orientation of the films is discussed in view of the AFM and RXRD results.

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页码：433 / 438

页数：6

相关论文

共 23 条

[1]

ALTMAN EI, 1993, ATOMIC NANOMETER SCA

[2] INVESTIGATION OF THE ELECTRONIC-STRUCTURE AND SPECTROSCOPY OF JAHN-TELLER DISTORTED C-60(+) [J].

BENDALE, RD ;

STANTON, JF ;

ZERNER, MC .

CHEMICAL PHYSICS LETTERS, 1992, 194 (4-6) :467-471

[3] MOLECULAR-DYNAMICS SIMULATIONS OF THE NANOMETER-SCALE MECHANICAL-PROPERTIES OF COMPRESSED BUCKMINSTERFULLERENE [J].

BRENNER, DW ;

HARRISON, JA ;

WHITE, CT ;

COLTON, RJ .

THIN SOLID FILMS, 1991, 206 (1-2) :220-223

[4] HEXAGONAL CLOSE-PACKED C-60 [J].

DEBOER, JL ;

VANSMAALEN, S ;

PETRICEK, V ;

DUSEK, M ;

VERHEIJEN, MA ;

MEIJER, G .

CHEMICAL PHYSICS LETTERS, 1994, 219 (5-6) :469-472

[5] PSEUDOTENFOLD SYMMETRY IN PENTANE-SOLVATED C60 AND C70 [J].

FLEMING, RM ;

KORTAN, AR ;

HESSEN, B ;

SIEGRIST, T ;

THIEL, FA ;

MARSH, P ;

HADDON, RC ;

TYCKO, R ;

DABBAGH, G ;

KAPLAN, ML ;

MUJSCE, AM .

PHYSICAL REVIEW B, 1991, 44 (02) :888-891

[6] SOLVATED C60 AND C60/C70 AND THE LOW-RESOLUTION SINGLE-CRYSTAL X-RAY STRUCTURE OF C60 [J].

GORUN, SM ;

CREEGAN, KM ;

SHERWOOD, RD ;

COX, DM ;

DAY, VW ;

DAY, CS ;

UPTON, RM ;

BRIANT, CE .

JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1991, (21) :1556-1558

[7] A DOUBLE-TEMPERATURE-GRADIENT TECHNIQUE FOR THE GROWTH OF SINGLE-CRYSTAL FULLERITES FROM THE VAPOR-PHASE [J].

HALUSKA, M ;

KUZMANY, H ;

VYBORNOV, M ;

ROGL, P ;

FEJDI, P .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1993, 56 (03) :161-167

[8] A CRYSTALLOGRAPHIC ANALYSIS OF C60 (BUCKMINSTERFULLERENE) [J].

HAWKINS, JM ;

LEWIS, TA ;

LOREN, SD ;

MEYER, A ;

HEATH, JR ;

SAYKALLY, RJ ;

HOLLANDER, FJ .

JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1991, (11) :775-776

[9] IMPROVED PURIFICATION OF C-60 AND FORMATION OF SIGMA-HOMOAROMATIC AND PI-HOMOAROMATIC METHANO-BRIDGED FULLERENES BY REACTION WITH ALKYL DIAZOACETATES [J].

ISAACS, L ;

WEHRSIG, A ;

DIEDERICH, F .

HELVETICA CHIMICA ACTA, 1993, 76 (03) :1231-1250

[10] SINGLE-CRYSTAL STRUCTURAL STUDY OF FCC AND HCP C60 FROM 107-K TO 298-K USING SYNCHROTRON X-RAYS [J].

KITAMOTO, T ;

SASAKI, S ;

ATAKE, T ;

TANAKA, T ;

KAWAJI, H ;

KIKUCHI, K ;

SAITO, K ;

SUZUKI, S ;

ACHIBA, Y ;

IKEMOTO, I .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1993, 32 (3B) :L424-L427