SCAN RATE DEPENDENCE OF THE APPARENT CAPACITANCE AT MICROVOLTAMMETRIC ELECTRODES

被引：48

作者：

WEHMEYER, KR ^{[1
]}

WIGHTMAN, RM ^{[1
]}

机构：

[1] INDIANA UNIV,DEPT CHEM,BLOOMINGTON,IN 47405

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1985年 / 196卷 / 02期

关键词：

D O I：

10.1016/0022-0728(85)80037-1

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

收藏

页码：417 / 421

页数：5

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